PROCEEDINGS VOLUME 4144
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
Advances in Laboratory-based X-Ray Sources and Optics
IN THIS VOLUME

6 Sessions, 26 Papers, 0 Presentations
Sources  (3)
Optics  (6)
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
Laser Sources
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 1 (2 November 2000); doi: 10.1117/12.405882
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 16 (2 November 2000); doi: 10.1117/12.405893
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 26 (2 November 2000); doi: 10.1117/12.405900
Sources
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 51 (2 November 2000); doi: 10.1117/12.405903
Laser Sources
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 38 (2 November 2000); doi: 10.1117/12.405904
Sources
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 68 (2 November 2000); doi: 10.1117/12.405905
Reflectometry
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 76 (2 November 2000); doi: 10.1117/12.405906
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 82 (2 November 2000); doi: 10.1117/12.405907
Microfocus Source/Optic Integration
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 86 (2 November 2000); doi: 10.1117/12.405883
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 95 (2 November 2000); doi: 10.1117/12.405884
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 100 (2 November 2000); doi: 10.1117/12.405885
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 110 (2 November 2000); doi: 10.1117/12.405886
Optics
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 137 (2 November 2000); doi: 10.1117/12.405887
Microfocus Source/Optic Integration
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 116 (2 November 2000); doi: 10.1117/12.405888
Optics
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 155 (2 November 2000); doi: 10.1117/12.405889
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 165 (2 November 2000); doi: 10.1117/12.405890
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 174 (2 November 2000); doi: 10.1117/12.405891
Optics and Applications
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 193 (2 November 2000); doi: 10.1117/12.405892
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 204 (2 November 2000); doi: 10.1117/12.405894
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 216 (2 November 2000); doi: 10.1117/12.405895
Laser Sources
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 43 (2 November 2000); doi: 10.1117/12.405896
Optics and Applications
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 228 (2 November 2000); doi: 10.1117/12.405897
Optics
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 183 (2 November 2000); doi: 10.1117/12.405898
Microfocus Source/Optic Integration
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 128 (2 November 2000); doi: 10.1117/12.405899
Optics
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 148 (2 November 2000); doi: 10.1117/12.405901
Sources
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, pg 59 (2 November 2000); doi: 10.1117/12.405902
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