Translator Disclaimer
2 November 2000 High-intensity monochromatic x-ray beam using doubly curved crystal optics
Author Affiliations +
Doubly curved crystals of Mica, Ge and Si were bent according to Johann-Geometry. Point-to-point focusing of characteristic x-rays can be used to create a highly intense focal spot (50 micrometers FWHM) of 6.7 X 108 photons/s using a doubly curved Ge crystal and a 15 W Cr x-ray source. The output focal spot size was shown to be dependent on the spot size of the source. Focal spots of less than 50 micrometers were achieved. Doubly curved crystals have useful properties for monochromatic micro x-ray fluorescence measurements.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zewu Chen and Jeffrey P. Nicolich "High-intensity monochromatic x-ray beam using doubly curved crystal optics", Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, (2 November 2000);


X ray optics imaging of a plasma source with...
Proceedings of SPIE (November 11 1994)
Stability issues in the use of coherent x-rays
Proceedings of SPIE (December 23 2003)
Development of bent crystal for imaging polarimetry
Proceedings of SPIE (September 17 2012)
Multilayers On Flexible Mica
Proceedings of SPIE (May 06 1985)

Back to Top