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2 November 2000 Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source
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Abstract
An experimental-analytical technique for x-ray phase retrieval and consequent crystal structure-factor determination is tested and discussed in the cases of high- (rotating anode or synchrotron radiation) or low-flux (fixed anode x-ray tubes) radiation sources. Experimentally measurable reflectivity magnitudes, using a rotating anode or conventional x-ray tube source, affect the directly reconstructed profile of the complex crystal structure-factor. Thermal and point defect diffuse scattering contaminates the tails of the Bragg diffracted intensity. A numerical procedure developed for the regularization of the directly reconstructed complex structure-factor allows the elimination of parasitic fringes in the resulting crystal-lattice strain profiles. In addition, replacement of plus/minus infinity limits in a mathematical formalism of the reconstruction procedure by actually measured experimental values of the scattering vector in practice affects the resulting profile of the complex crystal structure factor.
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Andrei Yurievich Nikulin and Peter Zaumseil "Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source", Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, (2 November 2000); https://doi.org/10.1117/12.405892
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