5 January 2001 Sagittally focusing multilayers for wiggler beamlines
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Proceedings Volume 4145, Advances in X-Ray Optics; (2001); doi: 10.1117/12.411649
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States
Abstract
A double crystal, multilayer monochromator was designed and fabricated for a wiggler beamline at the Cornell High Energy Synchrotron Source (CHESS). The monochromator consists of an internally water-cooled first substrate and a fixed-radius sagittally focusing second substrate, each coated with a multilayer consisting of 100 bilayers of Tungsten/Carbon with a 27 angstrom d-spacing. The wide energy bandpass of this multilayer along with sagittal focusing provides the best available flux for time resolved experiments. A flux 100 times that of conventional silicon monochromators is possible and allows for a finer time resolution for the crystal growth studies on this beamline. For other experimental uses, the higher intensity allows for more rapid data collection.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karl W. Smolenski, Randall L. Headrick, Chian Liu, Albert T. Macrander, "Sagittally focusing multilayers for wiggler beamlines", Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411649; https://doi.org/10.1117/12.411649
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KEYWORDS
Multilayers

Reflectivity

Monochromators

Crystals

Silicon

X-rays

Laser crystals

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