Simulated annealing in the design of broadband multilayers containing more than two materials

Keith Powell; Jamie M. Tait; Alan G. Michette

doi:10.1117/12.411645

5 January 2001 Simulated annealing in the design of broadband multilayers containing more than two materials

Keith Powell, Jamie M. Tait, Alan G. Michette

Author Affiliations +

Proceedings Volume 4145, Advances in X-Ray Optics; (2001) https://doi.org/10.1117/12.411645
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

A new method of design for multilayer structures with broadband spectral responses is presented. A stochastic design approach is utilized, based upon a simulated (SA) annealing algorithm, which optimizes the multilayer structure for a particular set of criteria. In particular, we consider a mirror for which the requirement is for high reflectivity, over a broad wavelength range, in the soft x-ray region, as might be compatible with the output from a laser plasma source. The design algorithm is used to maximize a merit function for the structure by manipulating the ordering, the thickness and the material types of each of the constituent layers. The merit function may also be configured to include a number of other desirable properties for the high reflectivity mirror including broad angular response, polarization response and uniformity of reflectivity over a prescribed wavelength range.

Citation Download Citation

Keith Powell, Keith Powell, Jamie M. Tait, Jamie M. Tait, Alan G. Michette, Alan G. Michette, "Simulated annealing in the design of broadband multilayers containing more than two materials", Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411645; https://doi.org/10.1117/12.411645

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