8 November 2000 XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source
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Abstract
The XM-1 soft x-ray microscope utilizes bending-magnet radiation from the Advanced Light Source in Berkeley, CA. This radiation is collected by a `large' (9 mm diameter) fresnel condenser zone plate which projects light through a pinhole and illuminates the sample. The radiation transmitted through the sample is then focused and magnified by a high-precision objective micro zone plate and recorded by a soft x-ray CCD camera. Our condenser zone plate and pinhole combination serves ad our adjustable monochromator for selecting the desired photon energy, giving us a (lambda) /(Delta) (lambda) of 700. This moderate spectral resolution allows for spectroscopic imaging with XM-1, including samples of magnetic materials with contrast provided by magnetic circular dichroism. Our user-friendly software programs allow for frequent utilization of complex image processing techniques.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Angelic L. Pearson, Angelic L. Pearson, Weilun Chao, Weilun Chao, Gregory Denbeaux, Gregory Denbeaux, Thomas Eimueller, Thomas Eimueller, Peter Fischer, Peter Fischer, Lewis E. Johnson, Lewis E. Johnson, Matthias Koehler, Matthias Koehler, Carolyn Larabell, Carolyn Larabell, Mark A. LeGros, Mark A. LeGros, Deborah Yager, Deborah Yager, David T. Attwood, David T. Attwood, } "XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source", Proc. SPIE 4146, Soft X-Ray and EUV Imaging Systems, (8 November 2000); doi: 10.1117/12.406672; https://doi.org/10.1117/12.406672
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