8 June 2000 Diffraction investigations by use of Kumakhov lenses
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Proceedings Volume 4155, Kumakhov Optics and Application; (2000) https://doi.org/10.1117/12.387871
Event: Kumakhov Optics and Applications, 2000, n/a, Russian Federation
Abstract
Main optical characteristics of Kumakhov x-ray systems (lenses, halflenses) were studied by means of coordinate metrological stand. Angular convergence and divergence of radiation, diffraction reflection of x-ray beams from monochromator versus angular divergence of halflenses have been investigated.
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Nariman S. Ibraimov, Svetlana V. Nikitina, Kirill N. Lopurko, "Diffraction investigations by use of Kumakhov lenses", Proc. SPIE 4155, Kumakhov Optics and Application, (8 June 2000); doi: 10.1117/12.387871; https://doi.org/10.1117/12.387871
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