23 January 2001 Crop height monitoring and surface parameter estimating using polarimetric and interferometric radar techniques
Author Affiliations +
Abstract
The paper presents different polarimetric and interferometric inversion radar approaches to extract the characteristics of vegetation and bare soil surfaces. The electromagnetic waves interactions with scatterers in a random medium are a complex process, which is sensitive to a much larger number of target parameters. Consequently, the estimation of surface and vegetation parameters can not be achieved by using fixed polarization single frequency interferometric SAR data, even when a simple homogeneous one-layer model is considered. In this way, some multibaseline SAR interferometric inversion algorithms have been proposed in order to extend the number of independent parameters. However, these models are based on the first-order scattering approximation, ignoring the effect of multiple scattering. The introduction of polarimetry provides an important tool to minimize multiple scattering effects by selecting the optimum scattering mechanisms, making parameter estimation more robust. Some indoor and outdoor measurements have been carried out to test these inversion techniques. The measurements have been conducted on bare rough surfaces and sorghum fields at different growth stages with a very accurate gound-truth. The results are compared to those obtained by applying other existing techniques, such as the Frecuency Correlation Function (FCF) and empirical inversion methods.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lluis Sagues, Xavier Fabregas, Antoni Broquetas, "Crop height monitoring and surface parameter estimating using polarimetric and interferometric radar techniques", Proc. SPIE 4171, Remote Sensing for Agriculture, Ecosystems, and Hydrology II, (23 January 2001); doi: 10.1117/12.413938; http://dx.doi.org/10.1117/12.413938
PROCEEDINGS
7 PAGES


SHARE
KEYWORDS
Scattering

Polarimetry

Vegetation

Data modeling

Interferometry

Multiple scattering

Radar

RELATED CONTENT

Ecology of extremophile yeasts
Proceedings of SPIE (July 06 1998)
Computer-Aided Speckle Pattern Interferometry
Proceedings of SPIE (December 13 1983)
New method to examine the curvature of the human cornea...
Proceedings of SPIE (August 01 1992)
Joint processing of Landsat ETM+ and ALOS PALSAR data for...
Proceedings of SPIE (October 17 2013)
Virtual OPC at hyper NA lithography
Proceedings of SPIE (March 27 2007)

Back to Top