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17 April 2001 Optical measurement of hypersonic microparticles using Mie scattering
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Proceedings Volume 4183, 24th International Congress on High-Speed Photography and Photonics; (2001) https://doi.org/10.1117/12.424324
Event: 24th International Congress on High-Speed Photography and Photonics, 2000, Sendai, Japan
Abstract
When the illumination wavelength is comparable to the object size, one is in the Mie scattering regime. In this regime geometrical optics breaks down because of diffraction effects, and image data must be interpreted on the basis electromagnetic wave theory. Mie scattering problems are difficult to solve because the full vector form of Maxwell's equations must be solved subject to the appropriate boundary conditions, without the benefit of the short wavelength approximation. In this paper we present the essentials of Mie scattering theory, introduce algorithms for computing Mie scattering, and show how Mie scattering concepts can be used to image fast-moving microparticles by visible light.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James B. Cole, Gopalan Jagadeesh, and Kazuyoshi Takayama "Optical measurement of hypersonic microparticles using Mie scattering", Proc. SPIE 4183, 24th International Congress on High-Speed Photography and Photonics, (17 April 2001); https://doi.org/10.1117/12.424324
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