Paper
17 April 2001 X-ray spot measurement and modulation transfer function for the 12-MeV LIA
Jinshui Shi, Jin Li, Qin Li, Dashi Luo
Author Affiliations +
Proceedings Volume 4183, 24th International Congress on High-Speed Photography and Photonics; (2001) https://doi.org/10.1117/12.424294
Event: 24th International Congress on High-Speed Photography and Photonics, 2000, Sendai, Japan
Abstract
The experimental system measuring the X-ray spot size for the 12 MeV LIA is given in this paper. By means of one-time discharge, the system adopts the sharpness-edge and big-hole imaging simultaneously, thereby acquiring the size of the X- ray spot and the shape of the spot. Using the density distribution of the image and combining with numerical calculating, the space distribution of spot intensity is simulated. At the same time, the modulation transfer function for the 12 MeV LIA X-ray imaging can be obtained with the system.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jinshui Shi, Jin Li, Qin Li, and Dashi Luo "X-ray spot measurement and modulation transfer function for the 12-MeV LIA", Proc. SPIE 4183, 24th International Congress on High-Speed Photography and Photonics, (17 April 2001); https://doi.org/10.1117/12.424294
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

X-ray imaging

Modulation transfer functions

Imaging systems

Computer simulations

Image resolution

Lead

Back to Top