9 November 2000 Characterization of semiconductor Bragg gratings for optical sensor applications
Author Affiliations +
Proceedings Volume 4185, Fourteenth International Conference on Optical Fiber Sensors; 418538 (2000) https://doi.org/10.1117/12.2302259
Event: Fourteenth International Conference on Optical Fiber Sensors, 2000, Venice, Italy
Abstract
The use of rigorous numerical methods shows that the widely used coupled mode theory is inadequate for the characterisation of semiconductor Bragg grating devices. Simulated results for various types of grating devices are presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. M. A. Rahman, B. M. A. Rahman, } "Characterization of semiconductor Bragg gratings for optical sensor applications", Proc. SPIE 4185, Fourteenth International Conference on Optical Fiber Sensors, 418538 (9 November 2000); doi: 10.1117/12.2302259; https://doi.org/10.1117/12.2302259
PROCEEDINGS
4 PAGES


SHARE
RELATED CONTENT

Accurate characterization of in-fiber gratings devices
Proceedings of SPIE (August 31 1999)
Mode beating in tapered high-power lasers
Proceedings of SPIE (August 17 2004)
Design of strong Bragg gratings in semiconductors
Proceedings of SPIE (July 29 2001)
Mode beating in tapered high-power lasers
Proceedings of SPIE (December 19 2004)
Integrated semiconductor laser rotation sensor
Proceedings of SPIE (March 25 1999)

Back to Top