Paper
10 November 1983 Characteristics of 3M Write-Once Archival Optical Storage Media
S. Lu, R. P. Freese, C. H. Chung, D. H. Davies, D. Evanicky, M. Alexander
Author Affiliations +
Proceedings Volume 0420, Optical Storage Media; (1983) https://doi.org/10.1117/12.936076
Event: 1983 Optical Mass Data Storage Conferences, 1983, Arlington, United States
Abstract
Recent efforts to improve the media sensitivity of optical recording have resulted in the development of various multi-layer constructions and in particular, the optically tuned anti-reflective trilayer configuration. In order to further enhance the recording sensitivity, many trilayer media use low melting materials such as tellurium or tellurium alloys for the light absorptive layer and/or a light transmissive layer that is easily sublimable, decomposable or vaporizable by the laser heat. In general, these materials compromise the media stability such that some form of environmental protection is required to ensure archival storage.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Lu, R. P. Freese, C. H. Chung, D. H. Davies, D. Evanicky, and M. Alexander "Characteristics of 3M Write-Once Archival Optical Storage Media", Proc. SPIE 0420, Optical Storage Media, (10 November 1983); https://doi.org/10.1117/12.936076
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KEYWORDS
Electron microscopes

Humidity

Optical storage

Scanning electron microscopy

Reflectivity

Computer simulations

Optical recording

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