Paper
10 November 1983 Characterization Of Optical Recording Disk Noise
M. Chen, A. E. Bell, V. Marrello
Author Affiliations +
Proceedings Volume 0420, Optical Storage Media; (1983) https://doi.org/10.1117/12.936084
Event: 1983 Optical Mass Data Storage Conferences, 1983, Arlington, United States
Abstract
Various sources of noise on Te-alloy optical recording disks are isolated and examined. Examples of disks in which substrate, Te-alloy coating, or recording noise dominates are presented. When a Te-alloy medium is properly chosen to minimize its coating and writing noise, a disk using a typical polymethylmethacrylate substrate has a carrier-to-noise ratio in excess of 60dB with a 30KHz bandwidth. For these low noise Te-alloy based disks, the substrate noise dominates.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Chen, A. E. Bell, and V. Marrello "Characterization Of Optical Recording Disk Noise", Proc. SPIE 0420, Optical Storage Media, (10 November 1983); https://doi.org/10.1117/12.936084
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Tellurium

Coating

Polymethylmethacrylate

Optical recording

Sensors

Reflectivity

Spectrum analysis

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