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3 October 2000 Method to demarcate the parameters of a CCD camera measuring system
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Proceedings Volume 4220, Advanced Photonic Sensors: Technology and Applications; (2000) https://doi.org/10.1117/12.401703
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
CCD device -- the photoelectric sensor of high sensitivity and high accuracy -- has been widely used in non-contact measuring and control system in industry. But the internal and external parameters and measuring system parameters of ordinary CCD camera vary with the working environment and condition, which affects the accuracy directly. According to rotary matrix, the mathematics model of measuring system of CCD camera is studied in the imagery way and the imagery model is given under the circumstances of non-parallel light. Based on this, the arithmetic is presented to demarcate the internal and external parameters and the measuring system parameters of ordinary CCD camera. It is not iterative, fast and accurate to demarcate. It has been applied in the measuring system of roller surface on line and produces better results.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jingfeng Guo, Shengxuan Zheng, and Guangxian Shen "Method to demarcate the parameters of a CCD camera measuring system", Proc. SPIE 4220, Advanced Photonic Sensors: Technology and Applications, (3 October 2000); https://doi.org/10.1117/12.401703
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