PROCEEDINGS VOLUME 4221
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS | 8-10 NOVEMBER 2000
Optical Measurement and Nondestructive Testing: Techniques and Applications
IN THIS VOLUME

1 Sessions, 98 Papers, 0 Presentations
Papers  (98)
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS
8-10 November 2000
Beijing, China
Papers
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 1 (9 October 2000); doi: 10.1117/12.402558
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 5 (9 October 2000); doi: 10.1117/12.402580
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 10 (9 October 2000); doi: 10.1117/12.402600
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 15 (9 October 2000); doi: 10.1117/12.402610
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 19 (9 October 2000); doi: 10.1117/12.402620
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 24 (9 October 2000); doi: 10.1117/12.402627
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 28 (9 October 2000); doi: 10.1117/12.402635
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 32 (9 October 2000); doi: 10.1117/12.402643
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 37 (9 October 2000); doi: 10.1117/12.402559
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 42 (9 October 2000); doi: 10.1117/12.402568
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 47 (9 October 2000); doi: 10.1117/12.402572
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 52 (9 October 2000); doi: 10.1117/12.402573
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 57 (9 October 2000); doi: 10.1117/12.402574
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 62 (9 October 2000); doi: 10.1117/12.402575
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 67 (9 October 2000); doi: 10.1117/12.402576
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 70 (9 October 2000); doi: 10.1117/12.402577
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 73 (9 October 2000); doi: 10.1117/12.402578
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 78 (9 October 2000); doi: 10.1117/12.402579
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 83 (9 October 2000); doi: 10.1117/12.402581
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 88 (9 October 2000); doi: 10.1117/12.402583
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 93 (9 October 2000); doi: 10.1117/12.402586
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 98 (9 October 2000); doi: 10.1117/12.402587
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 102 (9 October 2000); doi: 10.1117/12.402591
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 105 (9 October 2000); doi: 10.1117/12.402593
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 110 (9 October 2000); doi: 10.1117/12.402594
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 115 (9 October 2000); doi: 10.1117/12.402595
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 120 (9 October 2000); doi: 10.1117/12.402598
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 125 (9 October 2000); doi: 10.1117/12.402599
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 129 (9 October 2000); doi: 10.1117/12.402601
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 134 (9 October 2000); doi: 10.1117/12.402602
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 139 (9 October 2000); doi: 10.1117/12.402603
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 144 (9 October 2000); doi: 10.1117/12.402604
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 149 (9 October 2000); doi: 10.1117/12.402605
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 154 (9 October 2000); doi: 10.1117/12.402606
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 158 (9 October 2000); doi: 10.1117/12.402607
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 162 (9 October 2000); doi: 10.1117/12.402608
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 167 (9 October 2000); doi: 10.1117/12.402609
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 171 (9 October 2000); doi: 10.1117/12.402611
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 175 (9 October 2000); doi: 10.1117/12.402612
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 180 (9 October 2000); doi: 10.1117/12.402613
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 185 (9 October 2000); doi: 10.1117/12.402614
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 189 (9 October 2000); doi: 10.1117/12.402615
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 193 (9 October 2000); doi: 10.1117/12.402616
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 197 (9 October 2000); doi: 10.1117/12.402617
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 201 (9 October 2000); doi: 10.1117/12.402618
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 205 (9 October 2000); doi: 10.1117/12.402619
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 209 (9 October 2000); doi: 10.1117/12.402621
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 213 (9 October 2000); doi: 10.1117/12.402622
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 218 (9 October 2000); doi: 10.1117/12.402623
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 222 (9 October 2000); doi: 10.1117/12.402624
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 225 (9 October 2000); doi: 10.1117/12.402625
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 230 (9 October 2000); doi: 10.1117/12.402626
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 234 (9 October 2000); doi: 10.1117/12.402628
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 239 (9 October 2000); doi: 10.1117/12.402629
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 243 (9 October 2000); doi: 10.1117/12.402630
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 248 (9 October 2000); doi: 10.1117/12.402631
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 252 (9 October 2000); doi: 10.1117/12.402632
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 257 (9 October 2000); doi: 10.1117/12.402633
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 264 (9 October 2000); doi: 10.1117/12.402634
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 269 (9 October 2000); doi: 10.1117/12.402636
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 274 (9 October 2000); doi: 10.1117/12.402637
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 279 (9 October 2000); doi: 10.1117/12.402638
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 283 (9 October 2000); doi: 10.1117/12.402639
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 287 (9 October 2000); doi: 10.1117/12.402640
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 292 (9 October 2000); doi: 10.1117/12.402641
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 296 (9 October 2000); doi: 10.1117/12.402642
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 301 (9 October 2000); doi: 10.1117/12.402644
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 306 (9 October 2000); doi: 10.1117/12.402645
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 310 (9 October 2000); doi: 10.1117/12.402646
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 315 (9 October 2000); doi: 10.1117/12.402647
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 321 (9 October 2000); doi: 10.1117/12.402648
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 326 (9 October 2000); doi: 10.1117/12.402649
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 331 (9 October 2000); doi: 10.1117/12.402650
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 343 (9 October 2000); doi: 10.1117/12.402651
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 348 (9 October 2000); doi: 10.1117/12.402652
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 352 (9 October 2000); doi: 10.1117/12.402653
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 357 (9 October 2000); doi: 10.1117/12.402654
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 361 (9 October 2000); doi: 10.1117/12.402655
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 366 (9 October 2000); doi: 10.1117/12.402560
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 370 (9 October 2000); doi: 10.1117/12.402561
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 375 (9 October 2000); doi: 10.1117/12.402562
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 379 (9 October 2000); doi: 10.1117/12.402563
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 384 (9 October 2000); doi: 10.1117/12.402564
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 389 (9 October 2000); doi: 10.1117/12.402565
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 393 (9 October 2000); doi: 10.1117/12.402566
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 397 (9 October 2000); doi: 10.1117/12.402567
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 401 (9 October 2000); doi: 10.1117/12.402569
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 406 (9 October 2000); doi: 10.1117/12.402570
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 410 (9 October 2000); doi: 10.1117/12.402571
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 415 (9 October 2000); doi: 10.1117/12.402582
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 420 (9 October 2000); doi: 10.1117/12.402584
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 426 (9 October 2000); doi: 10.1117/12.402585
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 432 (9 October 2000); doi: 10.1117/12.402588
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 438 (9 October 2000); doi: 10.1117/12.402589
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 442 (9 October 2000); doi: 10.1117/12.402590
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 447 (9 October 2000); doi: 10.1117/12.402592
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 454 (9 October 2000); doi: 10.1117/12.402596
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, pg 457 (9 October 2000); doi: 10.1117/12.402597
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