Absolute phase measurement of linear integer unconcerned phase maps

Jingang Zhong

doi:10.1117/12.402651

9 October 2000 Absolute phase measurement of linear integer unconcerned phase maps

Jingang Zhong

Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402651
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

A procedure for the measurement of absolute phase values is presented and is used to measure the 3D shape of object with discontinuous height steps. This procedure is based on the linear integer unconcerned phase-maps. Linear integer unconcerned phase-maps are obtained by changing the projecting angle of grating or grating orientation. Experimental results for two kinds of projection optics are presented that demonstrate the validity of the principle.

Citation Download Citation

Jingang Zhong "Absolute phase measurement of linear integer unconcerned phase maps", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402651

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