9 October 2000 Closed-loop dynamic inspections by two-dimensional laser scan
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Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402623
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
In this paper we have described the fundamental principle and the concrete means of two-dimensional closed loop dynamic inspection system with laser scan. We have made an inquiry into the basic factors of affecting system stability and accuracy, and have given the concrete experimental data.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoman Wang, Lu Song, Jinliang Feng, "Closed-loop dynamic inspections by two-dimensional laser scan", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402623; https://doi.org/10.1117/12.402623
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