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9 October 2000 Flaw detection in a partially clamped plate using comparative DSPI
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Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402584
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
The paper presents a method to determine defects on a partially clamped plate using comparative digital speckle pattern interferometry (DSPI). The flaw locations are determined using fringe compensation. In flaw detection of a partially-clamped plate which contains a centric flaw, overcrowded fringe pattern is observed. When fringe compensation is applied, the overcrowded background fringes are removed leaving only fringes indicating the defective region. The results in this study show that the proposed method is effective in detecting both the location and size of the defects. Partially-clamped square plates of sides 80mm which contain centric circular flaws are loaded by incremental pressure and the results show that comparative DSPI is capable of flaw detection. Theory of the method and experimental results are presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cho Jui Tay, Huai Min Shang, and Chenggen Quan "Flaw detection in a partially clamped plate using comparative DSPI", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402584
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