9 October 2000 New inverse computation for optical-absorption coefficient in semiconductor material
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Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402636
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
In this paper, for an inhomogeneous material in which the thermal conductivity is varied as a function of depth, we propose an efficient method to inversely compute the depth distribution of optical-absorption coefficient by the surface temperature of the material. The results of inverse computation by a group of surface temperature data show that some more accurate optical- absorption coefficients can be obtained.
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Jianxin Zhu, Jianxin Zhu, } "New inverse computation for optical-absorption coefficient in semiconductor material", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402636; https://doi.org/10.1117/12.402636
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