9 October 2000 Solar panel substrate planeness measuring system by an optical triangulation method
Author Affiliations +
Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402575
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
The planeness measurement of solar panel substrate is a key problem in the manufacture procedure of satellites. The current measuring methods have the problems such as low precision and low efficiency. Based on the actual engineering project of the solar panel substrate planeness measuring system, a solar panel substrate planeness non-contact measuring system is presented, which employs an optical triangulation method and bases on virtual precise datum plane. By means of a declinate optical triangulation measuring instrument structure which is firstly proposed, the measured area and resolution of this measuring system are greatly increased, and the high accuracy non-contact measurement of the planeness of a large area plane is realized. On the basis of a new modeling method of virtual precise datum plane and measurement error compensation technique, the measuring system can accurately measure the solar panel substrate planeness on a non-precision plate. The actual measurement results show that the measurement accuracy 0.02mm (RMS) can be obtained when a solar panel substrate (2581mmx1755mm) planeness is measured by using of this measuring system.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian-cheng Fang, Jian-hui Zhao, Shiping Zhu, "Solar panel substrate planeness measuring system by an optical triangulation method", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402575; https://doi.org/10.1117/12.402575
PROCEEDINGS
5 PAGES


SHARE
RELATED CONTENT

Measurement of optical surfaces with knife edge method
Proceedings of SPIE (January 17 2008)
The Need For Second-Generation Gaging
Proceedings of SPIE (May 08 1971)
CAD/CAM-coupled image processing systems
Proceedings of SPIE (August 01 1990)
Defect And Measurement Evaluation System
Proceedings of SPIE (May 23 1983)

Back to Top