Translator Disclaimer
9 October 2000 Testing optical aspheric surfaces by aspheric characteristic interferogram
Author Affiliations +
Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000)
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
The interference pattern of the optical path difference between an aspherical optical surface and the corresponding best fit spherical surface is the Aspherics Characteristic Interferogram (ACI), which can be used as a template to test aspheric optical surfaces without test plates or null compensation systems. This direct interferometry can be used in the optical shop testing and in the digital phase-shifting spherical Fizeau interferometer to achieve high precise aspheric surface testing automatically. We succeeded in testing several aspheric surfaces by this method. ACI is also the base of phasing segmented mirrors, and six small- segmented mirrors were successfully combinated to a large mirror. If used in the infrared red interferometer, strongly aspheric surfaces with asphericity more than 40micrometers can also be tested. Experiments show that the ACI is a fast, effective aspherical surface measurement technique.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weimin Zheng and Tianning Cao "Testing optical aspheric surfaces by aspheric characteristic interferogram", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000);


A new method on measuring radius of curvature of a...
Proceedings of SPIE (September 01 2014)
Advances in interferometric surface measurement
Proceedings of SPIE (December 08 2005)
Interferometric testing for large optical elements
Proceedings of SPIE (October 05 2000)
Aspheric surface testing techniques
Proceedings of SPIE (December 31 1990)

Back to Top