10 October 2000 Approach to application of segment and its deformation measurement
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Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403840
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
A digital close photogrammetry approach is presented to application of segment and its deformation measurement, which is accurate and speedy. And it has been tested in application of segment and its deformation measurement in Yellow River Project of China. The practical results show that it is feasible.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tiejun Li, Tiejun Li, Zhiming Liu, Zhiming Liu, Jianhui Zhang, Jianhui Zhang, Yong Fang, Yong Fang, Xiaofeng Wang, Xiaofeng Wang, } "Approach to application of segment and its deformation measurement", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); doi: 10.1117/12.403840; https://doi.org/10.1117/12.403840
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