10 October 2000 Image simulation for photoelectric imaging system
Author Affiliations +
Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403837
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Use the transform function theory to analyze the imaging characteristic of photo electronic imaging system, and set up the simulation system for detecting characteristic of it with the high-speed DSP TMS320C6201. Through the simulation, we can evaluate the detecting characteristic of a certain photo electronic imaging system, change its components while simulating, and then compare the characteristic before change with after change to provide intuitionistic reference for optimizing design of photoelectric imaging system.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhengfeng Zou, Zhengfeng Zou, Hansheng Lu, Hansheng Lu, Tingzhu Bai, Tingzhu Bai, Zhiyun Gao, Zhiyun Gao, } "Image simulation for photoelectric imaging system", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); doi: 10.1117/12.403837; https://doi.org/10.1117/12.403837


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