10 October 2000 Interferogram processing with wavelet analysis and spectrogram reconstruction
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Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403916
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
Spatial modulated imaging Fourier-transform spectrometers (SMIFTS) have the advantage of high Etendue (throughput), therefore, compared with the temporal modulated IFTS, the interferogram obtained from SMIFTS have higher Signal-to-Noise Ratio (SNR). Despite of this, noise on the interferogram will also affect the quality of the spectrograms, which were reconstructed from the interferogram by discrete Fourier- transform (DFT). This paper particularly describes the noise and its effect on the spectrogram and presents a novel method to preprocess the interferogram by using of Wavelet analysis. The result between this method and traditional low pass filtering is given as well.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jianjun Chu, Yuejuan Jiang, Quanchen Li, Dazun Zhao, "Interferogram processing with wavelet analysis and spectrogram reconstruction", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); doi: 10.1117/12.403916; https://doi.org/10.1117/12.403916
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