10 October 2000 Interferogram processing with wavelet analysis and spectrogram reconstruction
Author Affiliations +
Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403916
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Spatial modulated imaging Fourier-transform spectrometers (SMIFTS) have the advantage of high Etendue (throughput), therefore, compared with the temporal modulated IFTS, the interferogram obtained from SMIFTS have higher Signal-to-Noise Ratio (SNR). Despite of this, noise on the interferogram will also affect the quality of the spectrograms, which were reconstructed from the interferogram by discrete Fourier- transform (DFT). This paper particularly describes the noise and its effect on the spectrogram and presents a novel method to preprocess the interferogram by using of Wavelet analysis. The result between this method and traditional low pass filtering is given as well.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jianjun Chu, Jianjun Chu, Yuejuan Jiang, Yuejuan Jiang, Quanchen Li, Quanchen Li, Dazun Zhao, Dazun Zhao, } "Interferogram processing with wavelet analysis and spectrogram reconstruction", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); doi: 10.1117/12.403916; https://doi.org/10.1117/12.403916

Back to Top