5 October 2000 Modulation transfer function testing of FPA using narrow-band laser speckle
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Proceedings Volume 4223, Instruments for Optics and Optoelectronic Inspection and Control; (2000) https://doi.org/10.1117/12.401797
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
This paper shows an approach using tunable narrowband speckle pattern generated by a double-slit aperture laid behind a new microcrystalline glass material scattering screen, for testing MTF of FPA between zero and twice Nyquist frequency. The measurement near to the Nyquist frequency, this method proved highly effective much better than that obtained by the Wide-band Laser Speckle.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qing Hua, Qing Hua, Wenlong Zheng, Wenlong Zheng, Yuguang Li, Yuguang Li, Yinzhong Liang, Yinzhong Liang, Ping'an He, Ping'an He, Song Li, Song Li, Jing Xu, Jing Xu, "Modulation transfer function testing of FPA using narrow-band laser speckle", Proc. SPIE 4223, Instruments for Optics and Optoelectronic Inspection and Control, (5 October 2000); doi: 10.1117/12.401797; https://doi.org/10.1117/12.401797
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