Paper
11 October 2000 X-ray source with microbeam
Kaige Wang, Hanben Niu
Author Affiliations +
Proceedings Volume 4224, Biomedical Photonics and Optoelectronic Imaging; (2000) https://doi.org/10.1117/12.403951
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
A novel x-ray source with micro-beam which has high brightness and micrometers or sub-micrometers micro-focus comprise primarily emitting system, focusing system, and permutable metallic foil targets. In this paper, the axial potential of system has been calculated by means of Boundary element method (BEM) and the electronic trajectory was traced by Runge-kutta method, respectively. The results show that when the temperature of LaB6 cathode is about 1900K and it was set behind the Wehnelt grid accurately and correctly, with partial pressures being kept below 10-7 torr, micro-focus electron-beam (60 microampere current) focused onto the face of target adapts to the producing x-ray micro- beam requirement.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kaige Wang and Hanben Niu "X-ray source with microbeam", Proc. SPIE 4224, Biomedical Photonics and Optoelectronic Imaging, (11 October 2000); https://doi.org/10.1117/12.403951
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-ray sources

Electron beams

X-rays

X-ray microscopy

Digital x-ray imaging

Imaging systems

Information operations

RELATED CONTENT

Seventh-generation CT
Proceedings of SPIE (March 31 2016)
Image-based characterization of microfocus x-ray target failure
Proceedings of SPIE (September 16 2016)
Effect of energy on x-ray penetration and image quality
Proceedings of SPIE (December 28 1998)
Measurement of center of rotation for projection in x ray...
Proceedings of SPIE (December 31 2010)

Back to Top