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9 October 2000 Measurement of deep modulation index of M-Z electro-optic modulator by using optical spectrum analyzer
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Proceedings Volume 4225, Optical Interconnects for Telecommunication and Data Communications; (2000) https://doi.org/10.1117/12.402700
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
The measurement of frequency responsibility is very difficult to carry out by swept-frequency method but instead of optical spectrum analyzer approach when the modulating frequency is higher than 50 GHz. We will present the measurement of modulation index in both of theoretical derivation and experimental demonstration in this paper.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hong Yi, Boyu Wu, Weiqing Zhou, Yanfei Li, Hui Yang, Bing Zhang, and Jihu M. Peng "Measurement of deep modulation index of M-Z electro-optic modulator by using optical spectrum analyzer", Proc. SPIE 4225, Optical Interconnects for Telecommunication and Data Communications, (9 October 2000); https://doi.org/10.1117/12.402700
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