Paper
20 October 2000 Overview of reticle enhancement technology software strategy
Alfred J. Reich, R. D. Jarvis, Steve Talent, Renee Carter
Author Affiliations +
Proceedings Volume 4226, Microlithographic Techniques in Integrated Circuit Fabrication II; (2000) https://doi.org/10.1117/12.404842
Event: International Symposium on Microelectronics and Assembly, 2000, Singapore, Singapore
Abstract
Although RET software technology has made great advances in recent years, very little attention has been paid to how this technology can be put into reliable and efficient use in a production environment. To stimulate EDA suppliers to take up this task, a system for not only automating RET, but also for generalizing the automation of RET is described.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alfred J. Reich, R. D. Jarvis, Steve Talent, and Renee Carter "Overview of reticle enhancement technology software strategy", Proc. SPIE 4226, Microlithographic Techniques in Integrated Circuit Fabrication II, (20 October 2000); https://doi.org/10.1117/12.404842
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KEYWORDS
Resolution enhancement technologies

Optical proximity correction

Electronic design automation

Reticles

Computer aided design

Photomasks

Manufacturing

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