Paper
6 October 2000 Achieving fast measurement of the 3D shape of large objects by sub-area stitching method
Xinmin Wu, Jinbang Chen
Author Affiliations +
Proceedings Volume 4231, Advanced Optical Manufacturing and Testing Technology 2000; (2000) https://doi.org/10.1117/12.402844
Event: International Topical Symposium on Advanced Optical Manufacturing and Testing Technology, 2000, Chengdu, China
Abstract
Since Moire metrology has the advantages such as non-contact, high accuracy, more automatic and high speed, so it is widely used in many fields. But it has some difficulties for large object measurement. For this reason, we proposed a new fringe- pattern stitching algorithm. The algorithm is simple and easy to achieve. Computer simulation prove that this algorithm is feasible.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xinmin Wu and Jinbang Chen "Achieving fast measurement of the 3D shape of large objects by sub-area stitching method", Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); https://doi.org/10.1117/12.402844
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
3D metrology

Moire patterns

Modulation

3D modeling

Computer simulations

Optical testing

Diffraction gratings

Back to Top