6 October 2000 Measurement of residual stress distribution of xenon flashlamp tube
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Proceedings Volume 4231, Advanced Optical Manufacturing and Testing Technology 2000; (2000) https://doi.org/10.1117/12.402823
Event: International Topical Symposium on Advanced Optical Manufacturing and Testing Technology, 2000, Chengdu, China
Abstract
A measuring method of residual stress distribution in xenon flashlamp tube is described in this paper. The stress birefringence of both front surface and back surface of the xenon flashlamp tube could be obtained quantitatively. In our experiments, the smallest measuring optical path difference is 0.2 nm. The resolution power of optical path difference of our system could be 0.01 nm. Preliminary measuring results indicate that this system could justify the measuring precision requirement of stress birefringence of xenon flashlamp tube. Because of the simple operation of this measuring system, this system is convenient to be automated at little cost of precision, which is a very important merit when there are mass measurements to do.
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Mu Zhou, Mu Zhou, Zhe Chen, Zhe Chen, Yongming Hu, Yongming Hu, Zhou Meng, Zhou Meng, Ming Ni, Ming Ni, } "Measurement of residual stress distribution of xenon flashlamp tube", Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); doi: 10.1117/12.402823; https://doi.org/10.1117/12.402823
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