6 October 2000 Wavefront measurement with synthesizing method
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Proceedings Volume 4231, Advanced Optical Manufacturing and Testing Technology 2000; (2000) https://doi.org/10.1117/12.402848
Event: International Topical Symposium on Advanced Optical Manufacturing and Testing Technology, 2000, Chengdu, China
Abstract
This paper discussed the test of a wavefront with large aperture using synthetic wavefront method. This method means the whole tested wavefront was divided into a limited numbers of sub-apertures and Moire fringe moving was used to measure the average slopes of wavefront on the sub-apertures and then the whole wavefront was synthesized. The paper dealt an actual large aperture optical system with 500 mm diameter and 13 m focal length.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cheng Wang, Cheng Wang, Changyuan Han, Changyuan Han, Chunguang Liu, Chunguang Liu, Hongyan Zhang, Hongyan Zhang, Xuemei Liu, Xuemei Liu, } "Wavefront measurement with synthesizing method", Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); doi: 10.1117/12.402848; https://doi.org/10.1117/12.402848
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