13 December 2000 Application of sol-gel technique for the technology of planar waveguide sensors and the influence of waveguide parameters on the sensitivity of difference interferometer
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Proceedings Volume 4239, Lightguides and their Applications; (2000) https://doi.org/10.1117/12.409185
Event: Lightguides and their Applications, 1999, Krasnobrod, Poland
Abstract
The work discusses the application potentials of sol-gel technique in the technology of planar waveguide sensors. The capability to form refractive profiles with the use of various techniques applied in planar optics have been compared. The authors present the results of investigation studies involving the application of sol-gel technique of the oxide system Si02:Ti02 for the formation of sensor layers, mask layers and waveguide layers. The influence of the thickness of waveguide layer and of its refractive index on the sensitivity of the meter measuring the refractive index changes and working in the difference interferometer system has been investigated.
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Pawel Karasinski, Pawel Karasinski, Aleksander Opilski, Aleksander Opilski, } "Application of sol-gel technique for the technology of planar waveguide sensors and the influence of waveguide parameters on the sensitivity of difference interferometer", Proc. SPIE 4239, Lightguides and their Applications, (13 December 2000); doi: 10.1117/12.409185; https://doi.org/10.1117/12.409185
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