13 December 2000 Parameters of thin films deposited on planar waveguides
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Proceedings Volume 4239, Lightguides and their Applications; (2000) https://doi.org/10.1117/12.409183
Event: Lightguides and their Applications, 1999, Krasnobrod, Poland
Abstract
Using the method of m-line spectroscopy [1] it is possible to determine parameters (thickness and refractive index) of thin films deposited on planar waveguides through indirect measurement of changes of coupling angle to the waveguide. The subject of the study were thin organic films deposited on waveguides by casting diluted polymerizable solutions, and by spin-coating thin polyimide films. These films are developed as active coatings in waveguide sensors. Numerical calculations (applied for three-layer structures) after modification to a four-layer structure allows for determining the parameters ofthin films.
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Elzbieta Augusciuk, Elzbieta Augusciuk, Marcin Roszko, Marcin Roszko, Wojciech Fabianowski, Wojciech Fabianowski, } "Parameters of thin films deposited on planar waveguides", Proc. SPIE 4239, Lightguides and their Applications, (13 December 2000); doi: 10.1117/12.409183; https://doi.org/10.1117/12.409183
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