Paper
4 June 2001 Generic and robust approach for the analysis of spot array images
Norbert Braendle, Horst Bischof, Hilmar Lapp
Author Affiliations +
Abstract
We present a generic and robust image analysis approach applicable to image data resulting from a broad class of hybridization experiments. The ultimate image analysis goal is to automatically assign a quantity to every array element (spot), giving information about the hybridization signal. Irrespective of the quantification strategy, the most important preliminary information to extract about a spot is the mapping between its location in the digital image and its position in the spot grid (grid fitting). We present a grid fitting approach divided into a spot amplification step (matched filter), a rotation estimation step (Radon transform) and a grid spanning step. Quantification of the hybridization signals is performed with different fitting approaches. The primary approach is a robust fitting of a parametric model with the help of M-estimators. The main advantage of parametric spot fitting is its ability to cope with overlapping spots. If the goodness-of-fit is too bad, a semi-parametric spot fitting is employed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norbert Braendle, Horst Bischof, and Hilmar Lapp "Generic and robust approach for the analysis of spot array images", Proc. SPIE 4266, Microarrays: Optical Technologies and Informatics, (4 June 2001); https://doi.org/10.1117/12.427983
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CITATIONS
Cited by 10 scholarly publications.
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KEYWORDS
Image filtering

Imaging arrays

Data modeling

Image analysis

Radon transform

Image resolution

Solids

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