1 May 2001 Modal birefringences measurement of multilayer multimodal AlGaAS/AlAs waveguides
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Abstract
We describe a technique for the simultaneous measurement of all the modal birefringences in a (chi) (2) optical guide through surface emitting second harmonic generation (SESHG), which we applied to multilayer AlGaAs waveguides at 1319 nm, both before and after selective AlAs oxidation. By end-fire coupling linearly-polarized laser pulses into ridge waveguides, both forward- and back-propagating eigenpolarizations were excited due to Fresnel reflection at the output facet. Several TE-TM pairs of counterpropagating modes then interact through the quadratic nonlinearity, giving rise to interference of SESHG fields. With a single image acquisition of the SESHG far field by a CCD camera, we could evaluate the modal birefringences between all the excited TE- TM mode pairs at the fundamental frequency. This simple approach led us to estimate form-birefringence of our multilayer quadratic waveguides with the high accuracy required by optimized phase-matched interactions in parametric generators and oscillators. This technique is a valuable complement to standard m-line effective index evaluation, and a versatile one-shot tool for waveguide diagnostics.
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Marco Secondini, Marco Secondini, Giuseppe Leo, Giuseppe Leo, Julien Nagle, Julien Nagle, Vincent Berger, Vincent Berger, Gaetano Assanto, Gaetano Assanto, } "Modal birefringences measurement of multilayer multimodal AlGaAS/AlAs waveguides", Proc. SPIE 4268, Growth, Fabrication, Devices, and Applications of Laser and Nonlinear Materials, (1 May 2001); doi: 10.1117/12.424634; https://doi.org/10.1117/12.424634
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