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1 May 2001 Modal birefringences measurement of multilayer multimodal AlGaAS/AlAs waveguides
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We describe a technique for the simultaneous measurement of all the modal birefringences in a (chi) (2) optical guide through surface emitting second harmonic generation (SESHG), which we applied to multilayer AlGaAs waveguides at 1319 nm, both before and after selective AlAs oxidation. By end-fire coupling linearly-polarized laser pulses into ridge waveguides, both forward- and back-propagating eigenpolarizations were excited due to Fresnel reflection at the output facet. Several TE-TM pairs of counterpropagating modes then interact through the quadratic nonlinearity, giving rise to interference of SESHG fields. With a single image acquisition of the SESHG far field by a CCD camera, we could evaluate the modal birefringences between all the excited TE- TM mode pairs at the fundamental frequency. This simple approach led us to estimate form-birefringence of our multilayer quadratic waveguides with the high accuracy required by optimized phase-matched interactions in parametric generators and oscillators. This technique is a valuable complement to standard m-line effective index evaluation, and a versatile one-shot tool for waveguide diagnostics.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marco Secondini, Giuseppe Leo, Julien Nagle, Vincent Berger, and Gaetano Assanto "Modal birefringences measurement of multilayer multimodal AlGaAS/AlAs waveguides", Proc. SPIE 4268, Growth, Fabrication, Devices, and Applications of Laser and Nonlinear Materials, (1 May 2001);


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