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23 April 2001 Time-correlated photon counting instrumentation for time-resolved photoluminescence measurement on semiconductor surfaces
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Proceedings Volume 4280, Ultrafast Phenomena in Semiconductors V; (2001) https://doi.org/10.1117/12.424732
Event: Symposium on Integrated Optics, 2001, San Jose, CA, United States
Abstract
In semiconductor research and industry the lifetime of carriers in the material is an important characteristic. Time-resolved photoluminescence (TRPL) is focused on the measurement and identification of electron-hole recombination processes. The length of time a photoexcited carrier remains in the valence band is directly related to material quality, purity and device performance. Band alignment, doping, stress and disorder in the semiconductor strongly influence the recombination dynamics. These features can be inferred by TRPL measurements on many materials and devices such as photovoltaic cells, heterojunction transistors, sensitive photodetectors, efficient laser diodes or bright LEDs. TRPL is contactless, nondestructive and highly sensitive. Nevertheless TRPL has mainly been used as a research tool with little incorporation into production and quality control since instrumentation was found to be expensive and difficult to use.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Wahl "Time-correlated photon counting instrumentation for time-resolved photoluminescence measurement on semiconductor surfaces", Proc. SPIE 4280, Ultrafast Phenomena in Semiconductors V, (23 April 2001); https://doi.org/10.1117/12.424732
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