Advanced Circularly Ruled Gratings for General Surface Metrology

Karl M. Bystricky; Teresa A. Fritz

doi:10.1117/12.936348

15 November 1983 Advanced Circularly Ruled Gratings for General Surface Metrology

Karl M. Bystricky, Teresa A. Fritz

Proceedings Volume 0429, Precision Surface Metrology; (1983) https://doi.org/10.1117/12.936348
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

The properties of a circularly ruled grating are discussed for the case in which the rulings are unequally spaced. This type of grating, which combines power and aberration control with conical mapping, is shown to be a key element in the design of the null corrector arm for an interferometer. Examples of test configurations are given for a non-linear axicon, a Wolter type telescope segment, and a fast aspheric.

Citation Download Citation

Karl M. Bystricky and Teresa A. Fritz "Advanced Circularly Ruled Gratings for General Surface Metrology", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); https://doi.org/10.1117/12.936348

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