Metric to evaluate the texture visibility of halftone patterns

Muge Wang; Kevin J. Parker

doi:10.1117/12.429486

8 June 2001 Metric to evaluate the texture visibility of halftone patterns

Muge Wang, Kevin J. Parker

Proceedings Volume 4299, Human Vision and Electronic Imaging VI; (2001) https://doi.org/10.1117/12.429486
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States

Abstract

Halftones are intended to produce the illusion of continuous images form binary output states, so the visibility of undesired halftone textures is an essential quality factor of halftone patterns. We propose a metric to predict the visibility of color halftone textures. The metric utilizes the human visual threshold function and contrast sensitivity functions of luminance and chrominance. The threshold is related to the average background luminance level by de Vries-Rose law. An iterative approach was used to determine the distance in which the visual error just exceeds the visual threshold. This distance is the metric that predicts the critical distance that a human observer can just discriminate the textures. To verify the metric, the texture visibility was determined experimentally by a psychological experiment. The halftone stimuli were presented on an SGI monitor. Starting from an initial distance, where the halftone images appeared as continuous color patches, the subject walked toward the monitor and found the distance where he or she could just discriminate the spatial changes caused by the textures. Then the distances determined by the experiment and those predicted by the metric were compared. A good correlation was achieved. The results show that the metric is able to predict the visibility over a wide range of texture characteristics.

Citation Download Citation

Muge Wang and Kevin J. Parker "Metric to evaluate the texture visibility of halftone patterns", Proc. SPIE 4299, Human Vision and Electronic Imaging VI, (8 June 2001); https://doi.org/10.1117/12.429486

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