22 December 2000 Fast profilometry based on the projection of a single grating at two frequencies
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Abstract
This paper presents a system for 3D vision based on the projection of bidimensional patterns of incoherent light and on phase coding. A novel projection scheme is exploited: two gratings at different wavelengths are combined into a single pattern a d demodulated in the natural domain of the signal to retrieval the depth information. Two phase maps are determined, whose sensitivity to height variations is proportional to the wavelength of the pattern gratings: the phase unwrapping is performed by compensating the phase uncertainty of the finest gratin with the information coming from the coarse one. Thus, both high measurement resolution and extended height range are obtained. The approach requires the acquisition of only one image, shows good robustness against fine variations of the fringe period and well adapts to the measurement of free-from shape. In this paper, the phase demodulation procedure and the unwrapping algorithm are detailed, and the accuracy of the measurement is discussed.
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Giovanna Sansoni, Giovanna Sansoni, Matteo Carocci, Matteo Carocci, } "Fast profilometry based on the projection of a single grating at two frequencies", Proc. SPIE 4309, Videometrics and Optical Methods for 3D Shape Measurement, (22 December 2000); doi: 10.1117/12.410879; https://doi.org/10.1117/12.410879
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