13 June 2001 Optoelectronic method for measurement of small dynamic displacements
Author Affiliations +
Proceedings Volume 4317, Second International Conference on Experimental Mechanics; (2001) https://doi.org/10.1117/12.429547
Event: Second International Conference on Experimental Mechanics, 2000, Singapore, Singapore
Abstract
The purpose of this paper is to show the developed laser interferometry for measurements of the small dynamic displacements. The optoelectronic method of the signal registration from laser interferometer and the method of the signal processing are presented. This technique allows us to determine the among and from of the dynamic displacements with high sensitivity and accuracy.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael N. Osipov, Sergey K. Grebennikov, "Optoelectronic method for measurement of small dynamic displacements", Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); doi: 10.1117/12.429547; https://doi.org/10.1117/12.429547
PROCEEDINGS
5 PAGES


SHARE
RELATED CONTENT

Interferometric Measurement Of Truss Joint Design Strengths
Proceedings of SPIE (December 25 1979)
Michelson interferometer system for seismic noise measurement
Proceedings of SPIE (February 13 2004)
Phase-Conjugate Interferometry
Proceedings of SPIE (May 23 1984)
Simplified phase-shifting holographic interferometry
Proceedings of SPIE (December 02 1993)

Back to Top