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28 June 2001 Experimental evaluation of a novel CdZnTe flat-panel x-ray detector for digital radiography and fluoroscopy
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Abstract
We made a prototype flat-panel X-ray detector with a polycrystalline CdZnTe film, and evaluated its imaging performance with respect to leakage current, X-ray sensitivity, MTF, DQE and image lag. The detector incorporates a novel hybrid technique in which zinc-doped CdTe is pre-deposited onto a ceramic substrate and then connected to a TFT circuit substrate. We carefully selected the material for the sensor substrate in order to avoid both incident x-ray attenuation in the substrate and micro-cracks in CdZnTe film. The film thickness was approximately 300 micrometers . The imaging area is composed of 512 X 384 pixels, with a pixel pitch of 150 micrometers .
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Satoshi Tokuda, Susumu Adachi, Toshiyuki Sato, Toshinori Yoshimuta, Hisashi Nagata, Kazuhiro Uehara, Yoshihiro Izumi, Osamu Teranuma, and Satoshi Yamada "Experimental evaluation of a novel CdZnTe flat-panel x-ray detector for digital radiography and fluoroscopy", Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); https://doi.org/10.1117/12.430924
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