28 June 2001 Fast imaging of a 41-cm amorphous silicon flat-panel detector for radiographic applications
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Proceedings Volume 4320, Medical Imaging 2001: Physics of Medical Imaging; (2001); doi: 10.1117/12.430888
Event: Medical Imaging 2001, 2001, San Diego, CA, United States
Abstract
A production 41cm square digital flat panel detector constructed of amorphous silicon with a cesium iodide scintillator was characterized for its applicability to 'fast' radiographic imaging. Representative fast imaging clinical applications include tomosynthesis and dual energy utilizing two exposures. The detector supports a read time of 125msec at a radiographic dynamic range of 7mR, giving a frame rate of 7.5 acquisitions per second. Detector performance measures of lag, detector sensitivity, and DQE were evaluated as a function of acquisition rate and exposure. The first frame lag is approximately 2% of the stimulus and decays to less than 0.5% for all subsequent frames. In a sequence at constant exposure, the lag builds up as the signal level grows to 5%, reaching a steady state after approximately 15 frames. The DQE measurement is affected by lag and must be corrected. The GE radiographic detector has outstanding dynamic performance and gives all indications that it will meet the fast imaging application requirements.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth S. Kump, "Fast imaging of a 41-cm amorphous silicon flat-panel detector for radiographic applications", Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); doi: 10.1117/12.430888; https://doi.org/10.1117/12.430888
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KEYWORDS
Sensors

X-rays

Signal to noise ratio

X-ray detectors

Amorphous silicon

Dual energy imaging

Electronics

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