3 July 2001 Nonlinear discriminant analysis
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Proceedings Volume 4322, Medical Imaging 2001: Image Processing; (2001); doi: 10.1117/12.431117
Event: Medical Imaging 2001, 2001, San Diego, CA, United States
Abstract
We describe a new nonlinear discriminant analysis method for feature extraction. This method applies a nonsingular transform to the data such that the transformed data have a Gaussian distribution. Then a Bayes likelihood ratio is calculated for the transformed data. The nonsingular transform makes use of wavelet transforms and histogram matching techniques. Wavelet transforms are an effective tool in analyzing data structures. Histogram matching is applied to the wavelet coefficients and the ordinary image pixel values in order to create a transformed image that has the desired Gaussian statistics.
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Hongbin Zhang, Eric Clarkson, Harrison H. Barrett, "Nonlinear discriminant analysis", Proc. SPIE 4322, Medical Imaging 2001: Image Processing, (3 July 2001); doi: 10.1117/12.431117; https://doi.org/10.1117/12.431117
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KEYWORDS
Stereolithography

Lithium

Statistical analysis

Wavelet transforms

Discrete wavelet transforms

Feature extraction

Image processing

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