Real Time Two-Wavelength Holography for Coarse Aspherical Surface Contouring

Chungte W . Chen

doi:10.1117/12.936805

9 December 1983 Real Time Two-Wavelength Holography for Coarse Aspherical Surface Contouring

Chungte W . Chen

Proceedings Volume 0433, Contemporary Methods of Optical Manufacturing and Testing; (1983) https://doi.org/10.1117/12.936805
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

Using two-wavelength holographic interferometry and a recyclable thermoplastic holographic camera, we developed a technique for real-time contouring of aspherical surfaces. Polished, fine-ground and coarse-ground surfaces were measured. Incorporating phase measurement interferometry with two-wavelength holographic interferometry, we have developed phase measurement two-wavelength holographic interferometry.

Citation Download Citation

Chungte W . Chen "Real Time Two-Wavelength Holography for Coarse Aspherical Surface Contouring", Proc. SPIE 0433, Contemporary Methods of Optical Manufacturing and Testing, (9 December 1983); https://doi.org/10.1117/12.936805

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