28 November 2000 Source of intense beam of ions with low energy
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Proceedings Volume 4340, 16th International Conference on Photoelectronics and Night Vision Devices; (2000) https://doi.org/10.1117/12.407752
Event: XVI International Conference on Photoelectronics and Night Vision Devices, 2000, Moscow, Russian Federation
Abstract
The plasmaoptical system of ion extraction allowed to form the ion beams, where the current is independent from extraction voltage, is analyzed. The temperature of discharge electrons ensured the equipotentiality of the magnetic field lines determines the minimal energy of beam. The offered source of tape beam will be used for those purposes, which require the large currents of ions with low energy.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. S. Gasanov, I. S. Gasanov, } "Source of intense beam of ions with low energy", Proc. SPIE 4340, 16th International Conference on Photoelectronics and Night Vision Devices, (28 November 2000); doi: 10.1117/12.407752; https://doi.org/10.1117/12.407752
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