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10 January 2002 Measuring spherical aberration for the dynamic compensation of substrate-thickness errors
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Proceedings Volume 4342, Optical Data Storage 2001; (2002)
Event: Optical Data Storage, 2001, Santa Fe, NM, United States
In high-density optical disc systems that use high-NA objective lenses and multi-layered discs, it is important to reduce spherical aberration (SA). With high-NA lenses, SA is induced by errors in substrate thickness. The distance between layers in multi-layered discs also leads to SA. To use a type of phase-shifting device as a dynamic compensator for SA, a method of differential focus-error detection has been proposed for the real-time measurement of SA as a spherical aberration signal (SAS). The derivation of an equivalent substrate-thickness variation from the SAS with an accuracy of up to 0.8 mm is demonstrated in this paper. Using the SAS to drive a liquid-crystal phase-shifter, the fluctuation of the SAS caused by the substrate thickness error has been suppressed successfully during real-time disc rotation.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takeshi Shimano, Tetsuo Ariyoshi, Mariko Umeda, Takeshi Maeda, Hirofumi Sukeda, Takuji Nomura, and Kouichi Murata "Measuring spherical aberration for the dynamic compensation of substrate-thickness errors", Proc. SPIE 4342, Optical Data Storage 2001, (10 January 2002);


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