Paper
20 August 2001 Luminescent materials for EUV detection purposes
Author Affiliations +
Abstract
In this paper we present the results of an elaborate study to investigate the properties of luminescent materials for EUV detection in EUV lithographic tools. The study presented here involves both bulk single crystalline samples and thin film samples. Bulk single crystalline samples with polished surfaces are industrially available, while thin film samples were home-made by performing physical vapor deposition of several luminescent materials on polished quartz substrates. Careful pre-selection of these phosphors was based on multiple strong criteria. The measured results presented here include time-resolved luminescence decay, luminescence spectra and luminescence linearity measurements under deep-UV (248 nm) and extreme-UV (13.5 nm) excitation. Our results indicate the possible use of two luminescent materials, being YAG:Ce (bulk) and CaS:Ce (thin film), for EUV detection in extreme-UV lithographic tools. Practical use of these luminescent materials, however, will require high extreme-UV powers in order to obtain a sufficient signal to noise ratio.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark Kroon and R. Stuik "Luminescent materials for EUV detection purposes", Proc. SPIE 4343, Emerging Lithographic Technologies V, (20 August 2001); https://doi.org/10.1117/12.436636
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Extreme ultraviolet

Luminescence

Deep ultraviolet

Thin films

Crystals

Quartz

Annealing

RELATED CONTENT

Study of Ti:sapphire layers created by PLD
Proceedings of SPIE (September 30 1996)
Effect of quenching temperature on the growth of a axis...
Proceedings of SPIE (December 22 1998)
Green photoluminescence from nc-Ge particles
Proceedings of SPIE (September 30 1996)
Influence of annealing on optical properties of ZnO film
Proceedings of SPIE (October 19 2001)

Back to Top