Absolute measurements of nonlinear absorption near LIDT at 193 nm

Holger Blaschke; Detlev Ristau; Eberhard Welsch; Oliver Apel

doi:10.1117/12.425057

12 April 2001 Absolute measurements of nonlinear absorption near LIDT at 193 nm

Holger Blaschke, Detlev Ristau, Eberhard Welsch, Oliver Apel

Proceedings Volume 4347, Laser-Induced Damage in Optical Materials: 2000; (2001) https://doi.org/10.1117/12.425057
Event: Laser-Induced Damage in Optical Materials: 2000, 2000, Boulder, CO, United States

Abstract

Previous investigations indicate that oxide coatings exhibit non-linear absorption phenomena below 200 nm. Hereby, absorption data of Al₂O₃ thin film coatings has been determined absolutely by laser calorimetry (LCA) at 193 nm in the low fluence regime. As an alternative, on the basis of the pulsed surface thermal lens technique (STL), photothermal measurements allow to determine the absorption relatively at fluence levels both in the subdamage fluence range far from the damage onset and close to the LIDT. By combining the two measurement techniques, the absolute determination of linear as well as multiphoton absorption can be achieved also in the vicinity of the laser damage fluences. This is of crucial interest because the initiation of damage onset can be observed immediately. Absolute absorption data of Al₂O₃ coatings at different laser fluences stating of some mJoule/cm² will be presented for the wavelength 193 nm. Thus, the correlation between the increase of absorption and the onset of breakdown can be illustrated impressively. The evaluation and discussion of the experimental results are focused on the degree of non-linearity of the investigated absorption behavior of oxide single layers initiating the optical breakdown of UV oxide coatings.

Citation Download Citation

Holger Blaschke, Detlev Ristau, Eberhard Welsch, and Oliver Apel "Absolute measurements of nonlinear absorption near LIDT at 193 nm", Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); https://doi.org/10.1117/12.425057

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available