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12 April 2001 CHARISMA: a new way for angular-resolved scattering measurements
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Abstract
In this paper, we present our new Coblentz Hemisphere based Angular Resolved and Integral Scattering Measurement Apparatus (CHARISMA). It is based on the combination of the well known Coblentz-Hemisphere used for integral scattering measurements and highly sensitive camera system developed at the Laser-Laboratorium Goettingen. Using CHARISMA, single- shot determination of the bidirectional reflectance distribution (BRDF) of optical samples is possible. Due to the spherical aberrations in the high-precision machined Coblentz-Hemisphere, the light scattered from a sample is not imaged onto a single spot but rather onto a stratified area. From this light distribution monitored by the camera system the angular-resolved scattering distribution can be evaluated unambiguously using a sophisticated complicated mathematical transformation.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oliver Apel, Christian Goerling, Uwe Leinhos, Klaus R. Mann, and Bernd Schaefer "CHARISMA: a new way for angular-resolved scattering measurements", Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); https://doi.org/10.1117/12.425029
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